Knowles, K. And Turan, S. 2000. High resolution transmission electron microscopy of grain boundaries between hexagonal boron nitride grains in Si3N4-SiC particulate composites. CRYSTAL RESEARCH AND TECHNOLOGY , vol.35, no.6-7 , 751-758.

Knowles, K., & Turan, S., (2000). High resolution transmission electron microscopy of grain boundaries between hexagonal boron nitride grains in Si3N4-SiC particulate composites. CRYSTAL RESEARCH AND TECHNOLOGY , vol.35, no.6-7, 751-758.

Knowles, KM, And S Turan. "High resolution transmission electron microscopy of grain boundaries between hexagonal boron nitride grains in Si3N4-SiC particulate composites," CRYSTAL RESEARCH AND TECHNOLOGY , vol.35, no.6-7, 751-758, 2000

Knowles, KM And Turan, S. "High resolution transmission electron microscopy of grain boundaries between hexagonal boron nitride grains in Si3N4-SiC particulate composites." CRYSTAL RESEARCH AND TECHNOLOGY , vol.35, no.6-7, pp.751-758, 2000

Knowles, K. And Turan, S. (2000) . "High resolution transmission electron microscopy of grain boundaries between hexagonal boron nitride grains in Si3N4-SiC particulate composites." CRYSTAL RESEARCH AND TECHNOLOGY , vol.35, no.6-7, pp.751-758.

@article{article, author={KM Knowles And author={S Turan}, title={High resolution transmission electron microscopy of grain boundaries between hexagonal boron nitride grains in Si3N4-SiC particulate composites}, journal={CRYSTAL RESEARCH AND TECHNOLOGY}, year=2000, pages={751-758} }