Caglar, M. Et Al. 2006. The determination of the thickness and optical constants of the ZnO crystalline thin film by using envelope method. JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS , vol.8, no.4 , 1410-1413.

Caglar, M., Caglar, Y., & Ilican, S., (2006). The determination of the thickness and optical constants of the ZnO crystalline thin film by using envelope method. JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS , vol.8, no.4, 1410-1413.

Caglar, M., Y. Caglar, And S. Ilican. "The determination of the thickness and optical constants of the ZnO crystalline thin film by using envelope method," JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS , vol.8, no.4, 1410-1413, 2006

Caglar, M. Et Al. "The determination of the thickness and optical constants of the ZnO crystalline thin film by using envelope method." JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS , vol.8, no.4, pp.1410-1413, 2006

Caglar, M. Caglar, Y. And Ilican, S. (2006) . "The determination of the thickness and optical constants of the ZnO crystalline thin film by using envelope method." JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS , vol.8, no.4, pp.1410-1413.

@article{article, author={M. Caglar Et Al. }, title={The determination of the thickness and optical constants of the ZnO crystalline thin film by using envelope method}, journal={JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS}, year=2006, pages={1410-1413} }