S. YERCİ Et Al. , "Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation," JOURNAL OF APPLIED PHYSICS , vol.102, no.2, 2007
YERCİ, S. Et Al. 2007. Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation. JOURNAL OF APPLIED PHYSICS , vol.102, no.2 .
YERCİ, S., YILDIZ, İ., Kulakci, M., Serincan, U., Barozzi, M., Bersani, M., ... TURAN, R.(2007). Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation. JOURNAL OF APPLIED PHYSICS , vol.102, no.2.
YERCİ, SELÇUK Et Al. "Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation," JOURNAL OF APPLIED PHYSICS , vol.102, no.2, 2007
YERCİ, SELÇUK Et Al. "Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation." JOURNAL OF APPLIED PHYSICS , vol.102, no.2, 2007
YERCİ, S. Et Al. (2007) . "Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation." JOURNAL OF APPLIED PHYSICS , vol.102, no.2.
@article{article, author={SELÇUK YERCİ Et Al. }, title={Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation}, journal={JOURNAL OF APPLIED PHYSICS}, year=2007}