Baake, O. Et Al. 2006. Determination of thickness, density and roughness of Co-Ni-Al single and multiple layer films deposited by high-vacuum e-beam evaporation on different substrates. Materials Characterization , vol.57, no.1 , 12-16.

Baake, O., Öksüzoglu, R., Flege, S., Hoffmann, P., Gottschalk, S., Fuess, H., ... Ortner, H.(2006). Determination of thickness, density and roughness of Co-Ni-Al single and multiple layer films deposited by high-vacuum e-beam evaporation on different substrates. Materials Characterization , vol.57, no.1, 12-16.

Baake, O. Et Al. "Determination of thickness, density and roughness of Co-Ni-Al single and multiple layer films deposited by high-vacuum e-beam evaporation on different substrates," Materials Characterization , vol.57, no.1, 12-16, 2006

Baake, O. Et Al. "Determination of thickness, density and roughness of Co-Ni-Al single and multiple layer films deposited by high-vacuum e-beam evaporation on different substrates." Materials Characterization , vol.57, no.1, pp.12-16, 2006

Baake, O. Et Al. (2006) . "Determination of thickness, density and roughness of Co-Ni-Al single and multiple layer films deposited by high-vacuum e-beam evaporation on different substrates." Materials Characterization , vol.57, no.1, pp.12-16.

@article{article, author={O. Baake Et Al. }, title={Determination of thickness, density and roughness of Co-Ni-Al single and multiple layer films deposited by high-vacuum e-beam evaporation on different substrates}, journal={Materials Characterization}, year=2006, pages={12-16} }