O. Gerek And D. Ece, "Power quality event detection using joint 2D-wavelet subspaces," 20th IEEE Instrumentation and Measurement Technology Conference , Colorado, United States Of America, pp.1460-1464, 2003
Gerek, O. And Ece, D. 2003. Power quality event detection using joint 2D-wavelet subspaces. 20th IEEE Instrumentation and Measurement Technology Conference , (Colorado, United States Of America), 1460-1464.
Gerek, O., & Ece, D., (2003). Power quality event detection using joint 2D-wavelet subspaces . 20th IEEE Instrumentation and Measurement Technology Conference (pp.1460-1464). Colorado, United States Of America
Gerek, ON, And DG Ece. "Power quality event detection using joint 2D-wavelet subspaces," 20th IEEE Instrumentation and Measurement Technology Conference, Colorado, United States Of America, 2003
Gerek, ON And Ece, DG. "Power quality event detection using joint 2D-wavelet subspaces." 20th IEEE Instrumentation and Measurement Technology Conference , Colorado, United States Of America, pp.1460-1464, 2003
Gerek, O. And Ece, D. (2003) . "Power quality event detection using joint 2D-wavelet subspaces." 20th IEEE Instrumentation and Measurement Technology Conference , Colorado, United States Of America, pp.1460-1464.
@conferencepaper{conferencepaper, author={ON Gerek And author={DG Ece}, title={Power quality event detection using joint 2D-wavelet subspaces}, congress name={20th IEEE Instrumentation and Measurement Technology Conference}, city={Colorado}, country={United States Of America}, year={2003}, pages={1460-1464} }