ÖNAL, Y. Et Al. 2016. Empirical mode decomposition application for short-term flicker severity. TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.24, no.2 , 499-509.

ÖNAL, Y., GEREK, Ö. N., & ECE, D. G., (2016). Empirical mode decomposition application for short-term flicker severity. TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.24, no.2, 499-509.

ÖNAL, YASEMİN, ÖMER NEZİH GEREK, And DOĞAN GÖKHAN ECE. "Empirical mode decomposition application for short-term flicker severity," TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.24, no.2, 499-509, 2016

ÖNAL, YASEMİN Et Al. "Empirical mode decomposition application for short-term flicker severity." TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.24, no.2, pp.499-509, 2016

ÖNAL, Y. GEREK, Ö. N. And ECE, D. G. (2016) . "Empirical mode decomposition application for short-term flicker severity." TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.24, no.2, pp.499-509.

@article{article, author={YASEMİN ÖNAL Et Al. }, title={Empirical mode decomposition application for short-term flicker severity}, journal={TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES}, year=2016, pages={499-509} }