Thermally stimulated current analysis of Zn1-xCdxO alloy films

AYBEK A. Ş., Baysal N., ZOR M., TURAN E., KUL M.

JOURNAL OF ALLOYS AND COMPOUNDS, cilt.509, sa.5, ss.2530-2534, 2011 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 509 Sayı: 5
  • Basım Tarihi: 2011
  • Doi Numarası: 10.1016/j.jallcom.2010.11.077
  • Dergi Adı: JOURNAL OF ALLOYS AND COMPOUNDS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.2530-2534
  • Anahtar Kelimeler: Oxide materials, Alloy films, Thermal analysis, Trap parameters, Chemical synthesis, Electronic properties, ULTRASONIC SPRAY-PYROLYSIS, THIN-FILMS, OPTICAL-PROPERTIES, TRANSPARENT CONDUCTORS, ELECTRICAL-PROPERTIES, SINGLE-CRYSTALS, ZINC-OXIDE, ZNO, DEPOSITION, TRAP
  • Anadolu Üniversitesi Adresli: Evet

Özet

We have studied the structural and electrical properties of Zn1-xCdxO alloy films deposited by ultrasonic spray pyrolysis technique. XRD measurement indicated that pure ZnO and CdO samples had single phases with hexagonal wurtzite and cubic structures, respectively. However, Zn1-xCdxO alloy films with x = 0.59 and 0.78 exhibited mixtures of a hexagonal wurtzite ZnO phase and a cubic CdO phase. Analysis of thermally stimulated current spectra of Zn1-xCdxO alloy films revealed the existence of a number of overlapped peaks each characterized by different trap energy levels located in the range of 0.033-0.215 eV below the conduction band. We have used curve fitting method for the evaluation of the trap parameters of the alloy films. The values of attempt-to-escape frequency v, capture cross-section S and concentration of the traps N-t have been determined. (C) 2010 Elsevier B.V. All rights reserved.