Influence of Deposition Technique on Growth and Resistivity of Ta/NiFe Nano Films.

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Capar O., Yildirim M., Cinar H., ÖKSÜZOĞLU R. M.

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, vol.65, 2009 (SCI-Expanded)

• Publication Type: Article / Abstract
• Volume: 65
• Publication Date: 2009
• Doi Number: 10.1107/s0108767309095671
• Journal Name: ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES
• Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED)
• Keywords: X-ray reflectivity, X-ray diffraction, resistivity
• Anadolu University Affiliated: Yes