Surface and Interface Study of Vanadium Oxide Nano Films

Creative Commons License

ÖKSÜZOĞLU R. M.

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, vol.65, 2009 (SCI-Expanded) identifier

  • Publication Type: Article / Abstract
  • Volume: 65
  • Publication Date: 2009
  • Doi Number: 10.1107/s0108767309098754
  • Journal Name: ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED)
  • Keywords: X-ray reflectivity, atomic force microcopy, resistivity, metal oxide thin films, sensors, TEMPERATURE
  • Anadolu University Affiliated: Yes