Surface and Interface Study of Vanadium Oxide Nano Films

ÖKSÜZOĞLU R. M.

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, vol.65, 2009 (SCI-Expanded)

• Publication Type: Article / Abstract
• Volume: 65
• Publication Date: 2009
• Doi Number: 10.1107/s0108767309098754
• Journal Name: ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES
• Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED)
• Keywords: X-ray reflectivity, atomic force microcopy, resistivity, metal oxide thin films, sensors, TEMPERATURE
• Open Archive Collection: AVESIS Open Access Collection
• Anadolu University Affiliated: Yes