Preparation, Structural and Morphological Properties of Nanostructure ZnO Films by Sol Gel Spin Coating

ÇAĞLAR M., RÜZGAR Ş.

10th International Vacuum Electron Sources Conference (IVESC), Saint Peter, Guernsey Ve Alderney, 30 Haziran - 04 Temmuz 2014, (Tam Metin Bildiri) identifier identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Doi Numarası: 10.1109/ivesc.2014.6891960
  • Basıldığı Şehir: Saint Peter
  • Basıldığı Ülke: Guernsey Ve Alderney
  • Anadolu Üniversitesi Adresli: Evet

Özet

In preset study, the sol-gel method was used to deposit ZnO films and silicon substrates were used as substrate. The effects of deposition temperature on the structural and morphological properties of ZnO films were investigated. X-ray diffraction (XRD) measurement showed that the ZnO films were crystallized in the hexagonal wurtzite phase and presented a preferential orientation along the c-axis. The current-voltage (I-V) characteristics of the diode were performed using a KEITHLEY 2400 sourcemeter. The pn heterojunction diode was fabricated and the diode parameters were determined from the analysis of the measured dark current-voltage curves. Rectifying behavior was observed from the I-V characteristics of these heterojunction diodes.