The dependence of equilibrium film thickness on grain orientation at interphase boundaries in ceramic-ceramic composites

Knowles K., Turan S.

ULTRAMICROSCOPY, vol.83, no.3-4, pp.245-259, 2000 (SCI-Expanded) identifier identifier identifier identifier

  • Publication Type: Article / Article
  • Volume: 83 Issue: 3-4
  • Publication Date: 2000
  • Doi Number: 10.1016/s0304-3991(00)00018-8
  • Journal Name: ULTRAMICROSCOPY
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.245-259
  • Keywords: high-resolution transmission electron microscopy (HRTEM), interfaces, ceramics, thin films, dispersion forces, Hamaker constant, SILICON-CARBIDE COMPOSITES, HAMAKER CONSTANTS, BORON-NITRIDE
  • Anadolu University Affiliated: No

Abstract

High-resolution transmission electron microscope observations of hexagonal boron nitride - 3C silicon carbide interphase boundaries suggest that where one or more phases is highly anisotropic, an orientation dependence on equilibrium film thickness can arise. Theoretical considerations of this phenomenon in terms of the equilibrium thickness of an amorphous film between two crystalline media are consistent with the trend seen experimentally. (C) 2000 Elsevier Science B.V. All rights reserved.