ULTRAMICROSCOPY, vol.83, no.3-4, pp.245-259, 2000 (SCI-Expanded)
High-resolution transmission electron microscope observations of hexagonal boron nitride - 3C silicon carbide interphase boundaries suggest that where one or more phases is highly anisotropic, an orientation dependence on equilibrium film thickness can arise. Theoretical considerations of this phenomenon in terms of the equilibrium thickness of an amorphous film between two crystalline media are consistent with the trend seen experimentally. (C) 2000 Elsevier Science B.V. All rights reserved.