The dependence of equilibrium film thickness on grain orientation at interphase boundaries in ceramic-ceramic composites

Knowles K., Turan S.

ULTRAMICROSCOPY, cilt.83, sa.3-4, ss.245-259, 2000 (SCI-Expanded) identifier identifier identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 83 Sayı: 3-4
  • Basım Tarihi: 2000
  • Doi Numarası: 10.1016/s0304-3991(00)00018-8
  • Dergi Adı: ULTRAMICROSCOPY
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.245-259
  • Anahtar Kelimeler: high-resolution transmission electron microscopy (HRTEM), interfaces, ceramics, thin films, dispersion forces, Hamaker constant, SILICON-CARBIDE COMPOSITES, HAMAKER CONSTANTS, BORON-NITRIDE
  • Anadolu Üniversitesi Adresli: Hayır

Özet

High-resolution transmission electron microscope observations of hexagonal boron nitride - 3C silicon carbide interphase boundaries suggest that where one or more phases is highly anisotropic, an orientation dependence on equilibrium film thickness can arise. Theoretical considerations of this phenomenon in terms of the equilibrium thickness of an amorphous film between two crystalline media are consistent with the trend seen experimentally. (C) 2000 Elsevier Science B.V. All rights reserved.