XRD Raman analysis and optical properties of CuS nanostructured film

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Hurma T., Kose S.

OPTIK, cilt.127, sa.15, ss.6000-6006, 2016 (SCI-Expanded, Scopus)

• Yayın Türü: Makale / Tam Makale
• Cilt numarası: 127 Sayı: 15
• Basım Tarihi: 2016
• Doi Numarası: 10.1016/j.ijleo.2016.04.019
• Dergi Adı: OPTIK
• Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
• Sayfa Sayıları: ss.6000-6006
• Anahtar Kelimeler: CuS nanostructured film, XRD, Raman, Optical constants, THIN-FILMS, DEPOSITION, SCATTERING, AMMONIA, LAYER
• Anadolu Üniversitesi Adresli: Evet

Özet

Raman spectroscopy and X-ray diffraction (XRD) methods were applied to determine the phase composition and crystal quality of CuS nanostructured film grown by spray pyrolysis.