XRD Raman analysis and optical properties of CuS nanostructured film

Hurma T., Kose S.

OPTIK, vol.127, no.15, pp.6000-6006, 2016 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 127 Issue: 15
  • Publication Date: 2016
  • Doi Number: 10.1016/j.ijleo.2016.04.019
  • Journal Name: OPTIK
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.6000-6006
  • Keywords: CuS nanostructured film, XRD, Raman, Optical constants, THIN-FILMS, DEPOSITION, SCATTERING, AMMONIA, LAYER
  • Anadolu University Affiliated: Yes


Raman spectroscopy and X-ray diffraction (XRD) methods were applied to determine the phase composition and crystal quality of CuS nanostructured film grown by spray pyrolysis.