XRD Raman analysis and optical properties of CuS nanostructured film

Hurma T., Kose S.

OPTIK, cilt.127, sa.15, ss.6000-6006, 2016 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 127 Sayı: 15
  • Basım Tarihi: 2016
  • Doi Numarası: 10.1016/j.ijleo.2016.04.019
  • Dergi Adı: OPTIK
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.6000-6006
  • Anahtar Kelimeler: CuS nanostructured film, XRD, Raman, Optical constants, THIN-FILMS, DEPOSITION, SCATTERING, AMMONIA, LAYER
  • Anadolu Üniversitesi Adresli: Evet

Özet

Raman spectroscopy and X-ray diffraction (XRD) methods were applied to determine the phase composition and crystal quality of CuS nanostructured film grown by spray pyrolysis.