Towards atomic scale engineering of rare-earth-doped SiAlON ceramics through aberration-corrected scanning transmission electron microscopy

YURDAKUL H., Idrobo J. C., Pennycook S. J., TURAN S.

SCRIPTA MATERIALIA, cilt.65, sa.8, ss.656-659, 2011 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 65 Sayı: 8
  • Basım Tarihi: 2011
  • Doi Numarası: 10.1016/j.scriptamat.2011.06.038
  • Dergi Adı: SCRIPTA MATERIALIA
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.656-659
  • Anahtar Kelimeler: Ceramics, Rare earth, Scanning transmission electron microscope (STEM), SiAlON, Z-contrast microscopy, LIGHT-EMITTING-DIODES, ALPHA-SIALON, OPTICAL-PROPERTIES, PHOSPHORS, PHOTOLUMINESCENCE, STABILITY, NITRIDE, YTTRIUM, POWDER, SIAION
  • Anadolu Üniversitesi Adresli: Evet

Özet

Direct visualization of rare earths in alpha- and beta-SiAlON unit-cells is performed through Z-contrast imaging technique in an aberration-corrected scanning transmission electron microscope. The preferential occupation of Yb and Ce atoms in different interstitial locations of beta-SiAlON lattice is demonstrated, yielding higher solubility for Yb than Ce. The triangular-like host sites in alpha-SiAlON unit cell accommodate more Ce atoms than hexagonal sites in beta-SiAlON. We think that our results will be applicable as guidelines for many kinds of rare-earth-doped materials. (C) 2011 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.