Metal-ceramic interface characterisation of capacitor-discharge joined alumina

Turan S., Ozkaya D., Bucklow I., Wallach E.

ELECTRON MICROSCOPY AND ANALYSIS 1999, sa.161, ss.79-82, 1999 (SCI-Expanded) identifier

  • Yayın Türü: Makale / Tam Makale
  • Basım Tarihi: 1999
  • Dergi Adı: ELECTRON MICROSCOPY AND ANALYSIS 1999
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED)
  • Sayfa Sayıları: ss.79-82
  • Anadolu Üniversitesi Adresli: Hayır

Özet

Capacitor discharge joining of ceramics offer bonding without the damaging effects of extended heating times. Microstructures formed in alumina-AlxNiyYz -alumina joints were investigated using a combination of EDX and PEELS in a dedicated STEM. A distinct reaction layer is formed between alumina grains and the amorphous AlxNiyYz foil. This layer contains several interesting microstructural features. It has a yttrium oxide dominated matrix with spherical aluminum particles. An analytical microscopy characterisation of these features have been demonstrated.