Low Loss Atomic Layer Deposited Al2O3 Waveguides for Applications in On-Chip Optical Amplifiers

DEMİRTAŞ M., Odaci C., KOSKU PERKGÖZ N., SEVİK C., AY F.

IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, cilt.24, sa.4, 2018 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 24 Sayı: 4
  • Basım Tarihi: 2018
  • Doi Numarası: 10.1109/jstqe.2018.2825880
  • Dergi Adı: IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Anahtar Kelimeler: Planar waveguides, optical losses, optical amplifiers, optical device fabrication, optical polarization, laser applications, dielectric waveguides, THIN-FILMS, SURFACE-CHEMISTRY, SILICON, IR, LUMINESCENCE, LASERS, CO
  • Anadolu Üniversitesi Adresli: Evet

Özet

We present the growth and optimization of ultralow loss Si-based Al2O3 planar waveguides, which have a high potential to boost the performance of rare-earth ion doped waveguide devices operating at visible and C-band wavelength ranges. The planar waveguide structures are grown using thermal atomic layer deposition. Systematic characterization of the obtained thin films is performed by spectroscopic ellipsometry, X-ray diffraction, Fourier transform infrared spectroscopy, and X-ray photoelectron spectroscopy analyses, and the optimum parameters are identified. The optical loss measurements for both transverse electric (TE) and transverse magnetic polarized light at 633, 829, and 1549 nm are performed. The lowest propagation loss value of 0.04 +/- 0.02 dB/cm for the Al2O3 waveguides for TE polarization at 1549 nm is demonstrated.