Identification of Ti incorporation into beta-SiAlON crystal structure through transmission electron microscopy techniques

YURDAKUL H., TURAN S.

CERAMICS INTERNATIONAL, cilt.38, sa.7, ss.5807-5811, 2012 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 38 Sayı: 7
  • Basım Tarihi: 2012
  • Doi Numarası: 10.1016/j.ceramint.2012.04.028
  • Dergi Adı: CERAMICS INTERNATIONAL
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.5807-5811
  • Anahtar Kelimeler: Electron microscopy, Spectroscopy, SiAlON, Ti
  • Anadolu Üniversitesi Adresli: Evet

Özet

In this paper, we report the transmission electron microscopy (TEM) observations on the incorporation of Ti transition metal element into beta-SiAlON crystal structure in a bulk beta-SiAlON-TiN composite material. Considering our energy dispersive X-ray (EDX) and electron energy loss (EEL) spectroscopy results acquired by using nanometre-scale focused electron probe in scanning transmission electron microscopy (STEM) mode, the Ti-K characteristic X-ray lines and Ti-L-3,L-2 edges were detected in the chemical composition of the beta-SiAlON grains. These results clearly reveal that Ti can enter into the beta-SiAlON crystal structure. It is anticipated that this data will provide the new engineering insights on the production of transition metal element doped SiAlON-based materials for different applications. (c) 2012 Elsevier Ltd and Techna Group S.r.l. All rights reserved.