Identification of Ti incorporation into beta-SiAlON crystal structure through transmission electron microscopy techniques


CERAMICS INTERNATIONAL, vol.38, no.7, pp.5807-5811, 2012 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 38 Issue: 7
  • Publication Date: 2012
  • Doi Number: 10.1016/j.ceramint.2012.04.028
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.5807-5811
  • Keywords: Electron microscopy, Spectroscopy, SiAlON, Ti
  • Anadolu University Affiliated: Yes


In this paper, we report the transmission electron microscopy (TEM) observations on the incorporation of Ti transition metal element into beta-SiAlON crystal structure in a bulk beta-SiAlON-TiN composite material. Considering our energy dispersive X-ray (EDX) and electron energy loss (EEL) spectroscopy results acquired by using nanometre-scale focused electron probe in scanning transmission electron microscopy (STEM) mode, the Ti-K characteristic X-ray lines and Ti-L-3,L-2 edges were detected in the chemical composition of the beta-SiAlON grains. These results clearly reveal that Ti can enter into the beta-SiAlON crystal structure. It is anticipated that this data will provide the new engineering insights on the production of transition metal element doped SiAlON-based materials for different applications. (c) 2012 Elsevier Ltd and Techna Group S.r.l. All rights reserved.