SiC Substrate Effects on Electron Transport in the Epitaxial Graphene Layer

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Arslan E., Cakmakyapan S., Kazar O., Butun S., LİŞESİVDİN S. B., CİNEL N. A., ...Daha Fazla

ELECTRONIC MATERIALS LETTERS, cilt.10, sa.2, ss.387-391, 2014 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 10 Sayı: 2
  • Basım Tarihi: 2014
  • Doi Numarası: 10.1007/s13391-013-3159-2
  • Dergi Adı: ELECTRONIC MATERIALS LETTERS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.387-391
  • Anahtar Kelimeler: gaphene, parallel conduction, raman spectroscopy, hall measurements, PARALLEL CONDUCTION, RAMAN, SPECTRUM
  • Anadolu Üniversitesi Adresli: Evet

Özet

Hall effect measurements on epitaxial graphene (EG) on SiC substrate have been carried out as a function of temperature. The mobility and concentration of electrons within the two-dimensional electron gas (2DEG) at the EG layers and within the underlying SiC substrate are readily separated and characterized by the simple parallel conduction extraction method (SPCEM). Two electron carriers are identified in the EG/SiC sample: one high-mobility carrier (3493 cm(2)/Vs at 300 K) and one low-mobility carrier (1115 cm(2)/Vs at 300 K). The high mobility carrier can be assigned to the graphene layers. The second carrier has been assigned to the SiC substrate.