Optical and structural properties of zinc oxide films with different thicknesses prepared by successive ionic layer adsorption and reaction method

TANER A., KUL M., TURAN E., AYBEK A. Ş., ZOR M., TAŞKÖPRÜ T.

THIN SOLID FILMS, cilt.520, sa.4, ss.1358-1362, 2011 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 520 Sayı: 4
  • Basım Tarihi: 2011
  • Doi Numarası: 10.1016/j.tsf.2011.04.066
  • Dergi Adı: THIN SOLID FILMS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.1358-1362
  • Anahtar Kelimeler: Zinc oxide, SILAR, Morphology, X-ray diffraction, Optical properties, ZNO FILMS, PHYSICAL-PROPERTIES, THIN-FILM, SURFACE, MORPHOLOGY, GROWTH
  • Anadolu Üniversitesi Adresli: Evet

Özet

In this work, zinc oxide semiconducting films belonging to the II-VI group have been produced by successive ionic layer adsorption and reaction (SILAR) method on glass substrates with 10, 15, 20 and 25 cycles at room temperature. Following the deposition, the samples were dried in air at 400 degrees C for 1 h. The films were characterized by X-ray diffraction, field emission scanning electron microscopy and optical absorption measurement techniques. The X-ray diffractions of the films showed that they are hexagonal in structure. The crystallite size of ZnO films varied between 34 and 38 nm accordingly with the number of SILAR cycles. The material has exhibited direct band gap transition with the band gap values lying in the range between 3.13 and 3.18 eV. The red shift is observed in the absorption edge as the cycles increased. Transmission of the films decreased from 65 to 40% with increasing the number of cycles. (C) 2011 Elsevier B. V. All rights reserved.