Bandgap variation of nanostructure tin doped CdO films via SILAR processing

Sahin B., Taskopru T., Bayansal F.

CERAMICS INTERNATIONAL, vol.40, no.6, pp.8709-8714, 2014 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 40 Issue: 6
  • Publication Date: 2014
  • Doi Number: 10.1016/j.ceramint.2014.01.089
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.8709-8714
  • Keywords: Grain size, X-ray methods, Optical properties, CdO, THIN-FILMS, ELECTRICAL-PROPERTIES, PHYSICAL-PROPERTIES, OPTICAL-PROPERTIES, SNO2
  • Anadolu University Affiliated: Yes


Five series of pure and tin-doped CdO films have been grown on amorphous glass substrates by the successive ionic layer adsorption and reaction (SILAR) method. The film's structural, morphological and optical properties have been investigated by X-ray diffraction (XRD), field emission scanning electron microscope (FESEM) and UV-vis spectrophotometer. XRD results showed that all of the films are polycrystalline cubic CdO. Doping of tin enhances the film's (111) preferred orientation and causes slight shift in the (111) Bragg angle towards higher value. From the FESEM images, it was seen that tin-doping concentration affects the shapes of the nanostructures. It was found that the tin-doping concentration modify the microstructures. With UV-vis analysis at the room temperature it was seen that the optical band gap and transmission properties of the films change with increasing tin concentration in the growth bath. (C) 2014 Elsevier Ltd and Techna Group S.r.l. All rights reserved.