Orientation-dependent equilibrium film thickness at interphase boundaries in ceramic-ceramic composites

Turan S., Knowles K.

ELECTRON MICROSCOPY AND ANALYSIS 1997, no.153, pp.483-486, 1997 (SCI-Expanded) identifier

  • Publication Type: Article / Article
  • Publication Date: 1997
  • Journal Name: ELECTRON MICROSCOPY AND ANALYSIS 1997
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED)
  • Page Numbers: pp.483-486
  • Anadolu University Affiliated: No

Abstract

Theoretical considerations of the Hamaker constant for the interaction of two media across a third suggest that the highly anisotropic nature of the refractive indices of a medium such as h-BN will produce an orientation dependence on equilibrium film thickness through their effect on the dominant dispersion energy term in the Hamaker constant. High resolution transmission electron microscope observations of h-BN - 3C SiC interphase boundaries confirm the expected trend in orientation dependence on equilibrium film thickness.