International Electronic Journal of Elementary Education, cilt.17, sa.2, ss.233-235, 2025 (Scopus)
This editorial introduces the IEJEE’s Special Issue on Large Scale Assessment: Challenges and Innovations, highlighting emerging themes and methodological advancements in educational measurement. The selected studies focus on process data utilization to examine test-taker behavior, innovations in psychometric modeling for assessment, classification, and the influence of social-emotional learning on academic achievement. This editorial discusses the contributions of the included studies, their implications for future research, and the evolving role of AI, machine learning, and digital assessment technologies in shaping the future of large-scale assessments.