3rd International Symposium on Growth of III-Nitrides (ISGN), Montpellier, France, 4 - 07 July 2010, vol.8
We present the experimental investigation of superconductivity in unintentionally doped MBE grown InN samples with various InN film thicknesses. A significant change in resistivity was observed at 3.82K, for an 1080 nm InN layer with carrier concentration n(3D) = 1.185x10(19) cm(-3). However, no significant resistance change was observed in the case of InN samples with carrier density of 1.024x10(19) cm(-3), 1.38x10(19) cm(-3), and thicknesses of 2070 and 4700 nm, respectively.