Analytical transmission electron microscopy observations on the stability of TiCN in electrically conductive alpha-beta SiAlON/TiCN composites
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, vol.34, no.12, pp.2905-2911, 2014 (SCI-Expanded, Scopus)
- Publication Type: Article / Article
- Volume: 34 Issue: 12
- Publication Date: 2014
- Doi Number: 10.1016/j.jeurceramsoc.2014.03.024
- Journal Name: JOURNAL OF THE EUROPEAN CERAMIC SOCIETY
- Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Page Numbers: pp.2905-2911
- Keywords: Composite, Electrical conductivity, SiAlON, TiCN, Transmission electron microscopy, SILICON-NITRIDE, THIN-FILMS, MICROSTRUCTURE, SI3N4-MOSI2, CERAMICS, EDM
- Anadolu University Affiliated: Yes
Abstract
Coating of alpha-beta SiAlON granules with TiCN powder led to a continuous 3D electrically conductive network formation. Here, the stability of TiCN grains following gas pressure sintering (GPS) and its effect on the electrical properties of an alpha-beta SiAlON/TiCN composite were analytically investigated by using transmission electron microscopy (TEM) based techniques. In situ formation of nano-sized SiC grains adjacent to TiCN and alpha-beta SiAlON grains were observed. These SiC grains may play a role on the high electrical conductivity of alpha-beta SiAlON/TiCN composite. Ti:C:N ratios from TiCN grains along the network showed that TiCN grains did not preserve their initial composition after sintering. Finally, Ti diffusion from TiCN grains into alpha-beta SiAlON and triple junction phases was observed. The incorporation of Ti into the SiAlON crystal lattices contributes to the high electrical conductivity of alpha-beta SiAlON/TiCN composite. (C) 2014 Elsevier Ltd. All rights reserved.