High resolution transmission electron microscopy of grain boundaries between hexagonal boron nitride grains in Si3N4-SiC particulate composites

Knowles K., Turan S.

CRYSTAL RESEARCH AND TECHNOLOGY, cilt.35, sa.6-7, ss.751-758, 2000 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 35 Sayı: 6-7
  • Basım Tarihi: 2000
  • Dergi Adı: CRYSTAL RESEARCH AND TECHNOLOGY
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.751-758
  • Anahtar Kelimeler: hexagonal boron nitride, transmission electron microscopy, grain boundaries, NANOTUBES
  • Anadolu Üniversitesi Adresli: Hayır

Özet

High resolution transmission electron microscope observations of grain boundaries in hexagonal boron nitride in which adjacent grains are rotated with respect to one another about either <2 (1) over bar (1) over bar 0> or <10 (1) over bar 0> directions are shown to be free of intergranular glass, in agreement with previous work. The implication of these observations is that the solid-solid boundary energies of such grain boundaries in hexagonal boron nitride are relatively small in magnitude.