High resolution transmission electron microscopy of grain boundaries between hexagonal boron nitride grains in Si3N4-SiC particulate composites
CRYSTAL RESEARCH AND TECHNOLOGY, vol.35, no.6-7, pp.751-758, 2000 (SCI-Expanded, Scopus)
- Publication Type: Article / Article
- Volume: 35 Issue: 6-7
- Publication Date: 2000
- Journal Name: CRYSTAL RESEARCH AND TECHNOLOGY
- Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Page Numbers: pp.751-758
- Keywords: hexagonal boron nitride, transmission electron microscopy, grain boundaries, NANOTUBES
- Anadolu University Affiliated: No
Abstract
High resolution transmission electron microscope observations of grain boundaries in hexagonal boron nitride in which adjacent grains are rotated with respect to one another about either <2 (1) over bar (1) over bar 0> or <10 (1) over bar 0> directions are shown to be free of intergranular glass, in agreement with previous work. The implication of these observations is that the solid-solid boundary energies of such grain boundaries in hexagonal boron nitride are relatively small in magnitude.