High resolution transmission electron microscopy of grain boundaries between hexagonal boron nitride grains in Si3N4-SiC particulate composites

Knowles K., Turan S.

CRYSTAL RESEARCH AND TECHNOLOGY, vol.35, no.6-7, pp.751-758, 2000 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 35 Issue: 6-7
  • Publication Date: 2000
  • Journal Name: CRYSTAL RESEARCH AND TECHNOLOGY
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.751-758
  • Keywords: hexagonal boron nitride, transmission electron microscopy, grain boundaries, NANOTUBES
  • Anadolu University Affiliated: No

Abstract

High resolution transmission electron microscope observations of grain boundaries in hexagonal boron nitride in which adjacent grains are rotated with respect to one another about either <2 (1) over bar (1) over bar 0> or <10 (1) over bar 0> directions are shown to be free of intergranular glass, in agreement with previous work. The implication of these observations is that the solid-solid boundary energies of such grain boundaries in hexagonal boron nitride are relatively small in magnitude.